Atomically resolved image of cleaved surfaces of compound semiconductors observed with an ultrahigh vacuum atomic force microscope
- 1 May 1995
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 13 (3) , 1265-1267
- https://doi.org/10.1116/1.587835
Abstract
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