Electron Microscope and Electron Diffraction Study of Fine Particles Prepared by Evaporation in Argon at Low Pressure. IV. Fine Particles of Tellurium
- 1 October 1975
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 14 (10) , 1425-1432
- https://doi.org/10.1143/jjap.14.1425