STM Study of Microindentations on Oriented Metallic Single Crystals
- 1 January 1993
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Imaging of low-load indentations into Si and GaAs by scanning tunneling microscopyUltramicroscopy, 1992
- STM profilometry of low-load Vickers indentations in a silicon crystalJournal of Physics D: Applied Physics, 1992
- Ceramic HardnessPublished by Springer Nature ,1990
- Elastic Recovery of Conical IndentationsProceedings of the Physical Society, 1961