Transmission electron microscopy study of Ag contacts to a- and c-axis oriented YBa2Cu3O7 thin films

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Abstract
The interface atomic structure of in situ sputter deposited silver contacts to a‐ and c‐axis oriented thin films of YBa2Cu3O7 (YBCO) was investigated with cross‐section transmission electron microscopy (TEM). A structurally disordered interface layer, approximately 25 Å thick, was found for Ag contacts to c‐axis oriented films. Electron diffraction analysis provides clear evidence for loss of the 11.7 Å lattice periodicity along the YBCO c‐axis in this zone. No such disordered interface layer could be identified in TEM images of Ag contacts to a‐axis oriented films. These findings may have important bearing on fabrication of high Tc proximity coupled superconductor/normal metal/superconductor Josephson devices.

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