Choosing a Practical MTTF Model for ECC Memory Chip
- 24 August 2005
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 255-261
- https://doi.org/10.1109/rams.1984.764301
Abstract
This paper presents an assessment and evaluation of the leading memory chip error correction code (ECC) reliability prediction models. Criteria was developed and applied to four of the currently most popular ECC memory chip reliability models. The characteristic analysis, reliability prediction models and modifications to these reliability prediction models are presented along with the criteria. A selection of a model was then made based on its high correlation with the latest prediction data. An example analysis is also presented.Keywords
This publication has 2 references indexed in Scilit:
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- Special Feature: Semiconductor Memory Reliability with Error Detecting and Correcting CodesComputer, 1976