Effects of proton irradiation on AlGaN/InGaN/GaNgreen lightemitting diodes

Abstract
The influence of proton irradiation on properties of commercial single-quantum-well AlGaN/InGaN/GaN green-light emitting diodes is studied. A dose of 2.3 Mrad degraded the room-temperature light emission from the irradiated area of the device, while the electrical device characteristics remain practically unchanged. At low temperatures (≃15 K), however, the light emission recovers almost entirely, indicating the formation of a nonradiative recombination channel within the active layer of the device.