Parametric identification of two-port models in the frequency domain
- 9 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 263-271
- https://doi.org/10.1109/imtc.1991.161590
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Description of a parametric maximum likelihood estimator in the frequency domain for multi-input, multi-output systems and its application to flight flutter analysisMechanical Systems and Signal Processing, 1990
- Robust identification of transfer functions in the s- and z-domainsIEEE Transactions on Instrumentation and Measurement, 1990
- Measurement of frequency response functions in noisy environmentsIEEE Transactions on Instrumentation and Measurement, 1990
- On the use of signals with a constant signal-to-noise ratio in the frequency domainIEEE Transactions on Instrumentation and Measurement, 1990
- Vector ARMAX modeling approach in multi-input modal analysisMechanical Systems and Signal Processing, 1989
- A maximum likelihood estimator for linear and nonlinear systems-a practical application of estimation techniques in measurement problemsIEEE Transactions on Instrumentation and Measurement, 1988
- Modeling the noise influence on the Fourier coefficients after a discrete Fourier transformIEEE Transactions on Instrumentation and Measurement, 1986
- Estimation in a Multivariate "Errors in Variables" Regression Model: Large Sample ResultsThe Annals of Statistics, 1981
- A Generalization of the TSD Network-Analyzer Calibration Procedure, Covering n-Port Scattering-Parameter Measurements, Affected by Leakage ErrorsIEEE Transactions on Microwave Theory and Techniques, 1977
- On a moment theorem for complex Gaussian processesIEEE Transactions on Information Theory, 1962