Thickness Measurement of Thin Coatings by X—Ray Absorption
- 1 March 1946
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 17 (3) , 99-101
- https://doi.org/10.1063/1.1770449
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- An X-ray goniometer using beams of large aperture for photographically recording crystal-powder reflectionsProceedings of the Physical Society, 1937
- The quantitative measurement of the intensity of X-ray reflections from crystalline powdersProceedings of the Physical Society, 1935