X-FINE – a refinement program for FEFF input parameters
- 1 January 1997
- journal article
- Published by International Union of Crystallography (IUCr) in Journal of Synchrotron Radiation
- Vol. 4 (1) , 36-38
- https://doi.org/10.1107/s0909049596011569
Abstract
X-FINE is an interactive and user-friendly tool to optimize input parameters (S20, sigma2, DeltaE) of the FEFF program, a package for EXAFS analysis.Keywords
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