High Rate X-Ray Fluorescence Analysis by Pulsed Excitation
- 1 June 1972
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 19 (3) , 392-395
- https://doi.org/10.1109/tns.1972.4326755
Abstract
We describe the application of pulsed X-ray excitation to X-ray fluorescence spectrometry as a method for increasing the output counting rate of the system by a substantial factor. Using a pulsed X-ray tube that is immediately turned off when a signal is detected, and held off during the pulse processing time, it is possible to eliminate the need for a pulse pile-up rejection. We have achieved output counting rates significantly greater than with conventional operation for equivalent shaping networks. No significant degradation in spectrometer resolution was observed at the increased counting rates.Keywords
This publication has 1 reference indexed in Scilit:
- Pulsed Feedback Tecniques for Semicondctor Detector Radiation SpectrometersIEEE Transactions on Nuclear Science, 1971