Experimental low-voltage point-projection microscopy and its possibilities
- 31 December 1993
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 52 (3-4) , 473-477
- https://doi.org/10.1016/0304-3991(93)90063-4
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Transmission low-energy electron diffraction (TLEED) and its application to the low-voltage point-projection microscopeActa Crystallographica Section A Foundations of Crystallography, 1993
- Theory of the point source electron microscopeUltramicroscopy, 1992
- Transmission-electron Fourier imaging of crystal lattices using low-voltage field-emission sources: TheoryPhysical Review B, 1992
- Atomic resolution in lensless low-energy electron holographyPhysical Review Letters, 1991
- Calibration of the operating parameters for an HB5 stem instrumentUltramicroscopy, 1986
- Electron diffraction phenomena observed with a high resolution STEM instrumentJournal of Electron Microscopy Technique, 1986
- Field-ion transmission microscopyJournal of Physics E: Scientific Instruments, 1979
- Fourier Images: I - The Point SourceProceedings of the Physical Society. Section B, 1957
- The Formation of the Diffraction Image with Electrons in the Gabor Diffraction MicroscopeJournal of the Optical Society of America, 1952
- Point Projector Electron MicroscopePhysical Review B, 1939