A self-consistent analytic threshold voltage model for thin SOI n-channel MOSFETs

This publication has 8 references indexed in Scilit:

• Unified charge control model and subthreshold current in heterostructure field-effect transistors
  IEEE Electron Device Letters, 1990
• An analytic model for thin SOI transistors
  IEEE Transactions on Electron Devices, 1989
• Analysis of conduction in fully depleted SOI MOSFETs
  IEEE Transactions on Electron Devices, 1989
• Two-dimensional simulation and measurement of high-performance MOSFETs made on a very thin SOI film
  IEEE Transactions on Electron Devices, 1989
• Electrical and radiation characterization of three SOI material technologies
  IEEE Circuits and Devices Magazine, 1987
• Subthreshold slope of thin-film SOI MOSFET's
  IEEE Electron Device Letters, 1986
• Calculated threshold-voltage characteristics of an XMOS transistor having an additional bottom gate
  Solid-State Electronics, 1984
• Threshold voltage model of ESFI-SOS-MOS transistors
  IEEE Transactions on Electron Devices, 1978