Cavity perturbation method for measurement of permittivity and conductivity of medium lossy semiconductors and dielectrics
- 28 February 1971
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 14 (2) , 153-166
- https://doi.org/10.1016/0038-1101(71)90090-6
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Direct Measurement of the Dielectric Constants of Silicon and GermaniumPhysical Review B, 1953
- Methods of Measuring the Properties of Ionized Gases at High Frequencies. II. Measurement of Electric FieldJournal of Applied Physics, 1952