Valency changeover in Sm layers on Si(111)7×7 studied with soft-x-ray-absorption spectroscopy
- 15 February 1993
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 47 (7) , 3797-3801
- https://doi.org/10.1103/physrevb.47.3797
Abstract
The valency changeover in Sm overlayers on Si(111)7×7 is probed with high accuracy using x-ray-absorption spectroscopy at the Sm edges. The valency of Sm has been studied as a function of the layer thickness in the chemisorption regime, and compared with the results obtained for epitaxially grown samarium silicide layers.
Keywords
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