Analysis of Frequency-Conversion Techniques in Measurements of Microwave Transistor Noise Temperatures
- 1 November 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 25 (11) , 870-873
- https://doi.org/10.1109/tmtt.1977.1129234
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Source Mismatch Effects on Measurements of Linear Two-Port Noise TemperaturesIEEE Transactions on Instrumentation and Measurement, 1975
- Computer-aided determination of two-port noise parameters (CADON)Proceedings of the IEEE, 1970
- The determination of device noise parametersProceedings of the IEEE, 1969
- IRE Standards on Methods of Measuring Noise in Linear Twoports, 1959Proceedings of the IRE, 1960