Scanning tunneling microscopy of semiconductor (n-ZnO)/liquid interfaces under potentiostatic conditions
- 1 September 1989
- journal article
- Published by Elsevier in Surface Science
- Vol. 219 (1-2) , L515-L520
- https://doi.org/10.1016/0039-6028(89)90194-5
Abstract
No abstract availableFunding Information
- Ministry of Education, Culture, Sports, Science and Technology (63850160)
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