Deposition of epitaxial thin films of Nd1.85Ce0.15CuO4−y by laser ablation
- 23 October 1989
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 55 (17) , 1795-1797
- https://doi.org/10.1063/1.102321
Abstract
Thin films of the electron‐doped superconductor Nd1.85 Ce0.15 CuO4−y have been deposited on (100) SrTiO3 substrates at 780 °C using the laser ablation technique. The deposited films are very smooth and show epitaxial growth with the c axis normal to the substrate. The transport properties of the films are very sensitive to the concentration of oxygen vacancies. Films deposited and cooled in the presence of 150 mTorr O2 exhibit localization behavior with no evidence of superconductivity down to 5 K. Superconductivity is observed on vacuum annealing the films in situ after deposition. Films with optimum concentration of oxygen vacancies show a superconducting onset temperature of 21 K and Tc (R=0) of 20 K, with a critical current density of 2×105 A/cm2 at 5.5 K in zero magnetic field.Keywords
This publication has 10 references indexed in Scilit:
- Synthesis and x-ray characterization of superconducting and related Ln2−xCexCuO4−y (Ln=Nd and Gd) compoundsPhysica C: Superconductivity and its Applications, 1989
- Growth and anisotropic superconducting properties of Nd2–xCexCu04–y single crystalsNature, 1989
- Epitaxial films of YBa2Cu3O7−δ on NdGaO3, LaGaO3, and SrTiO3 substrates deposited by laser ablationApplied Physics Letters, 1989
- Superconductivity at 27 K in fluorine-doped Nd2Cu04Nature, 1989
- Hall coefficients and optical properties ofsingle-crystal thin filmsPhysical Review B, 1989
- A superconducting copper oxide compound with electrons as the charge carriersNature, 1989
- Epitaxial growth of YBa2Cu3O7−x thin films by a laser evaporation processApplied Physics Letters, 1988
- Direct preparation of high-Tc-superconducting films by laser ablationSolid State Communications, 1988
- As-deposited high T c and J c superconducting thin films made at low temperaturesApplied Physics Letters, 1988
- Characterization of epitaxial films by grazing-incidence X-ray diffractionThin Solid Films, 1987