Profiling of the dielectric function across Al/SiO2/Si heterostructures with electron energy loss spectroscopy
- 31 May 1992
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 41 (1-3) , 41-54
- https://doi.org/10.1016/0304-3991(92)90093-y
Abstract
No abstract availableKeywords
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