Some elementary connections between curvature and mismatch strain in compositionally graded thin films
- 1 May 1996
- journal article
- Published by Elsevier in Journal of the Mechanics and Physics of Solids
- Vol. 44 (5) , 723-736
- https://doi.org/10.1016/0022-5096(96)00008-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- The stress distribution and curvature of a general compositionally graded semiconductor layerJournal of Crystal Growth, 1993
- Calculation of stresses in GaAs/Si strained heterostructuresJournal of Crystal Growth, 1992
- Calculation of stresses in In0.12Ga0.88As ternary bulk crystals with compositionally graded In1 − xGaxAs layers on GaAs seedsJournal of Crystal Growth, 1991