Critical assessment and modification of Robinson's method for the ellipsometric investigation of thin film materials
- 1 November 1972
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 13 (2) , 335-339
- https://doi.org/10.1016/0040-6090(72)90303-3
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Measurement and Correction of First-Order Errors in EllipsometryJournal of the Optical Society of America, 1971
- Some aspects of polarizer performanceJournal of Physics E: Scientific Instruments, 1971
- Azimuthal Misalignment and Surface Anisotropy as Sources of Error in EllipsometryApplied Optics, 1970
- Improved Electronic Half-Shadow Method for the Measurement of Birefringence and DichroismReview of Scientific Instruments, 1967
- Longitudinal Kerr Magneto-Optic Effect in Thin Films of Iron, Nickel, and Permalloy*Journal of the Optical Society of America, 1963
- Transmission of Light through Birefringent and Optically Active Media: the Poincaré SphereJournal of the Optical Society of America, 1954