Statistical approach to theory of electron-avalanche ionization in solids
- 1 October 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 17 (10) , 2023-2026
- https://doi.org/10.1109/jqe.1981.1070641
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Statistical analysis of defect-caused laser damage in thin filmsApplied Optics, 1977
- Laser-induced damage in ZnSeApplied Physics Letters, 1974