Defects Observed in Electron Irradiated Pure Silver by Electron Microscopy

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Abstract
Nominally 99.9999% pure silver strips were irradiated near 140°K with 3 MeV electrons. Fluences ranged from 0.05 to 6.7×1018 electrons/cm2. In order to observe defects which exist in irradiated specimens by electron microscopy at temperatures below stage III annealing, specimens were thinned, washed, and mounted on a specimen holder below −60°C. They were also dried below −60°C and observed using a liquid‐nitrogen cooling stage. A large number of interstitial loops were observed below stage III. The number of loops was constant but the size of the loops increased with increasing fluence. They shrank and disappeared during stage III annealing. After annealing at 0°C, another kind of small dot defects were observed. The results suggest that the stage III annealing occurs by a vacancy or divacancy migration in electron irradiated pure silver.

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