HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPE
- 2 August 1985
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 139 (2) , RP1-RP2
- https://doi.org/10.1111/j.1365-2818.1985.tb02628.x
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Observation of magnetic domains with spin-polarized secondary electronsApplied Physics Letters, 1984
- Spin and Energy Analyzed Secondary Electron Emission from a FerromagnetPhysical Review Letters, 1982