Automatic test generation using neural networks
- 6 January 2003
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Automatic test generation using neural networksPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- An optically programmed neural networkPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1988
- Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of ImagesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1984
- Neurons with graded response have collective computational properties like those of two-state neurons.Proceedings of the National Academy of Sciences, 1984
- The Yorktown Simulation EnginePublished by Association for Computing Machinery (ACM) ,1982
- An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic CircuitsIEEE Transactions on Computers, 1981
- Polynomially Complete Fault Detection ProblemsIEEE Transactions on Computers, 1975
- On the Necessity to Examine D-Chains in Diagnostic Test Generation—An Example [Letter to the Editor]IBM Journal of Research and Development, 1967