Characterization of Si1−xGex/Si (100) heterostructures by photoluminescence and admittance spectroscopy
- 1 July 1992
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 10 (4) , 2002-2007
- https://doi.org/10.1116/1.586175