Optical Properties of Lead Lanthanum Zirconate Titanate Amorphous Ferroelectric-Like Thin Films
- 1 March 2000
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 39 (3R)
- https://doi.org/10.1143/jjap.39.1180
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Ellipsometric spectra and optical constants of PLZT thin filmsFerroelectrics, 1999
- In Situ Annealing Studies of Sol‐Gel Ferroelectric Thin Films by Spectroscopic EllipsometryJournal of the American Ceramic Society, 1995
- Electrical characterizations of polycrystalline and amorphous thin films of Pb(ZrxTi1−x)O3 and BaTiO3 prepared by sol—gel techniqueJournal of Non-Crystalline Solids, 1994
- Properties of Piezoelectric Pzt Thin Films for Microactuator ApplicationsMRS Proceedings, 1994
- Spectroscopic ellipsometry studies on ion beam sputter deposited Pb(Zr, Ti)O3 films on sapphire and Pt-coated silicon substratesThin Solid Films, 1993
- Ferroelectric thin films prepared by sol-gel processingIntegrated Ferroelectrics, 1992
- PLZT electrooptic materials and applications—a reviewFerroelectrics, 1987
- Microscopic model for a ferroelectric glassPhysical Review B, 1977
- Dispersion of optical and electro-optic properties of hot-pressed PLZT ceramic materialsFerroelectrics, 1974
- Behavior of the Electronic Dielectric Constant in Covalent and Ionic MaterialsPhysical Review B, 1971