In situ surface X-ray diffraction using high-energy synchrotron radiation: studies of the ADP (100) and (101) growth interfaces under aqueous solution flow conditions

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Abstract
Using the cell, preliminary surface diffraction data have been recorded from the (101) and (100) crystal/solution interfaces of nearly perfect crystals of ammonium dihydrogen orthophosphate during growth and dissolution experiments under aqueous solution flow conditions. The measurements of the X-ray rocking curves during the growth of these faces provide further evidence that the X-ray diffraction peak width depends on the growth conditions and that this technique is capable of assessing structural changes in the crystal surface during growth.

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