Overlayer Test of Surface Photoemission Effect in Cu(100)
- 7 April 1997
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 78 (14) , 2807-2810
- https://doi.org/10.1103/physrevlett.78.2807
Abstract
Angle-resolved photoemission from bulk valence bands of a single crystal yields direct-transition peaks that are often distorted due to interference with broadband indirect emission induced by the surface. The present study is a direct test of this surface effect by using an overlayer to modify the surface boundary condition. A Cu(100) single crystal exhibited a rather asymmetric direct-transition peak and a significant indirect emission intensity. Deposition of a thin Ag overlayer shielded the Cu surface from vacuum, and both the peak asymmetry and the indirect emission intensity were suppressed.
Keywords
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