Electrical conduction and observation of local defects in thin sandwich structures of Cu-SiO/CeO2-Cu
- 1 November 1987
- journal article
- research article
- Published by Taylor & Francis in International Journal of Electronics
- Vol. 63 (5) , 707-722
- https://doi.org/10.1080/00207218708939176
Abstract
AC and DC conduction in MIM sandwich structures based on SiO/CeO2 as a dielectric prepared by the co-evaporation technique has been investigated before and after electroforming for different compositions. The electroformed samples show voltage-controlled negative resistance (VCNR), voltage-memory, thermal-voltage-memory and pressure-voltage-memory effects and the results are explained in terms of the filamentary model of electrical conduction. The positive electrode was investigated using a scanning electron microscope to observe the effects of electroforming and the liberation of gas as a result of the application of high electric fieldsKeywords
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