Reliability of plastic‐encapsulated logic circuits

• 1 January 1989
• journal article
• Published by Wiley in Quality and Reliability Engineering International
• Vol. 5  (1) , 53-72
• https://doi.org/10.1002/qre.4680050111

Abstract

Keywords

• PLASTIC ENCAPSULATION
• LOGIC CIRCUITS
• RELIABILITY
• FIELD DATA