Measurement repetitions of the Si (220) lattice spacing
- 23 November 2004
- journal article
- correction
- Published by IOP Publishing in Metrologia
- Vol. 41 (6) , 445-446
- https://doi.org/10.1088/0026-1394/41/6/c01
Abstract
Recently, the Istituto di Metrologia 'G Colonnetti' (IMGC) and the National Metrology Institute of Japan (NMIJ) reported joint measurements of the (220) lattice plane spacing of Si. These measurements were carried out at both the IMGC and the NMIJ to resolve a discrepancy between previous determinations. It has been found subsequently that the laser beam used in the IMGC apparatus was not perfectly monochromatic, and consequently an error occurred in the IMGC's measurement. Full details are provided in the PDF file.Keywords
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