Far Infrared Measurement of the Dielectric Properties of GaAs and CdTe at 300 K and 8 K
- 1 August 1969
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 8 (8) , 1667-1671
- https://doi.org/10.1364/ao.8.001667
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
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