A novel SAM technique for the direct measurement of backscattering factors and the elucidation of background shapes in AES
- 30 April 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 152-153, 877-883
- https://doi.org/10.1016/0039-6028(85)90500-x
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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