Image registration in electron microscopy: Application of a robust method
- 1 September 1988
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 10 (1) , 27-33
- https://doi.org/10.1002/jemt.1060100105
Abstract
The geometric registration of two electron microscopic images generally is performed by maximizing the cross‐correlation coefficient between them. We show that a new similarity measure (the number of sign changes) is useful for performing simultaneously geometric and gray‐level registration. This method is robust, which means that it provides a good estimation of the parameters even in the presence of outliers that cannot be described by the registration model.Keywords
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