Sample cell for EXAFS measurements on molten materials at elevated temperatures
- 1 March 1980
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 51 (3) , 388-389
- https://doi.org/10.1063/1.1136190
Abstract
We describe the design, fabrication, and utilization of a simple sample cell for extended x‐ray absorption fine structure (EXAFS) measurements at elevated temperature. The cell is rigid, inert, easy to fabricate, cheap and effective in maintaining the critical specimen dimensions of both solid and liquid samples up to 1000 °C.Keywords
This publication has 1 reference indexed in Scilit:
- Structural determinations of liquid semiconductors using extended X-ray absorption fine structureCanadian Journal of Chemistry, 1977