Microfaceting of 90° [100] tilt boundaries in YBa2Cu3O7−x thin films
Open Access
- 15 March 1993
- journal article
- Published by Elsevier in Physica C: Superconductivity and its Applications
- Vol. 207 (3-4) , 239-246
- https://doi.org/10.1016/0921-4534(93)90305-a
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Growth mechanisms and properties of 90° grain boundaries in thin filmsPhysical Review B, 1992
- Characteristics of high performance YBa2Cu3O7 step-edge junctionsApplied Physics Letters, 1992
- The microstructure of epitaxial YBa2Cu3O7 films on steep steps in LaAlO3 substratesPhysica C: Superconductivity and its Applications, 1992
- The atomic structure of growth interfaces in Y–Ba–Cu–O thin filmsJournal of Materials Research, 1991
- Absence of weak-link behaviour in YBa2Cu307 grains connected by 90° [010] twist boundariesNature, 1991
- Microstructure of epitaxial YBa2Cu3O7 films on step-edge SrTiO3 substratesPhysica C: Superconductivity and its Applications, 1991
- Microstructure and defects in a-axis oriented YBa2Cu3O7−x thin filmsPhysica C: Superconductivity and its Applications, 1991
- Epitaxial and Smooth Films of a -Axis YBa 2 Cu 3 O 7Science, 1990
- Weak-link-free behaviour of high-angle YBa2Cu3O7–δ grain boundaries in high magnetic fieldsNature, 1990
- HREM investigations of defects in sintered YBa2Cu3O7–δPhysica Status Solidi (a), 1988