Characterization and modeling of metal-resistance-semiconductor photodetectors
- 1 June 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (3) , 957-960
- https://doi.org/10.1109/23.603784
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- New avalanche device with the ability of analog few-photon pulse detectionPublished by SPIE-Intl Soc Optical Eng ,1995
- Single photon avalanche diode for single molecule detectionReview of Scientific Instruments, 1993
- The use of avalanche photodiodes for the detection of soft x raysReview of Scientific Instruments, 1992
- Observation of avalanche propagation by multiplication assisted diffusion in p-n junctionsApplied Physics Letters, 1990