X-ray polarimetry and position measurement using the photoeffect and charge diffusion in a CCD
- 1 December 1995
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 367 (1-3) , 215-219
- https://doi.org/10.1016/0168-9002(95)00544-7
Abstract
No abstract availableKeywords
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