Backscatter readout from serial microbending sensors
- 1 October 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Lightwave Technology
- Vol. 2 (5) , 700-709
- https://doi.org/10.1109/JLT.1984.1073681
Abstract
Backscattering measurements performed on test fibers perturbed by several serially placed microbending sensors reveal the surprising result that the loss induced in a given sensor is nearly independent of the losses induced in the other sensors. A simple theoretical model is constructed to predict the conditions under which this desirable phenomenon can occur.Keywords
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