Morphological Transformation of Palladium Caused by Measurement of a Scanning Tunneling Microscope
- 1 August 1991
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 30 (8R)
- https://doi.org/10.1143/jjap.30.1826
Abstract
It was observed that scanning the surface of palladium (Pd) for imaging with a scanning tunneling microscope (STM) caused the morphological change of the surface: The morphology of Pd was transformed from a rough surface to a flat one. This observation suggests that the surface was changed so as to reduce the surface energy. In the case of platinum, the morphology also changed to a certain degree. However, the change was not as drastic as compared with that of Pd. It is supposed that this morphological transformation was due to an electrostatic force (image force) between the STM tip and the metal surface.Keywords
This publication has 7 references indexed in Scilit:
- Making a Monolayer Hole in a Graphite Surface by Means of a Scanning Tunneling MicroscopeJapanese Journal of Applied Physics, 1990
- Etching of silicon (111) with the scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1990
- Scanning tunneling microscopy observation of MoS2 surface and gold clusters deposited on MoS2 surfaceJournal of Vacuum Science & Technology A, 1990
- Fabrication of nucleation sites for nanometer size selective deposition by scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1990
- Nanometer scale structuring of silicon by direct indentationJournal of Vacuum Science & Technology A, 1990
- Surface modification in the nanometer range by the scanning tunneling microscopeJournal of Vacuum Science & Technology A, 1988
- Tunneling microscopy, lithography, and surface diffusion on an easily prepared, atomically flat gold surfaceJournal of Applied Physics, 1988