Detection of Point Defect Chains in Ion Irradiated Silicon by High Resolution Electron Microscopy
- 1 January 1980
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On the possibility of the direct imaging of point defects in crystals using transmission electron microscopyPhilosophical Magazine, 1977
- Computer experiments for tilted beam dark-field imagingUltramicroscopy, 1976
- EPR study of neutron-irradiated silicon: A positive charge state of thesplit di-interstitialPhysical Review B, 1976