Influence of high-temperature annealing on positron annihilation in electron-irradiated silicon
- 16 June 1978
- journal article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 47 (2) , K149-K152
- https://doi.org/10.1002/pssa.2210470263
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Positron escape from annihilation centers in electron-irradiated Si crystalsPhysics Letters A, 1975
- The measurement of the formation energy of a vacancy in Cu by positron annihilationJournal of Physics F: Metal Physics, 1973
- Electrical Studies of Electron-Irradiated-Type Si: Impurity and Irradiation-Temperature DependencePhysical Review B, 1967
- Recovery of Electrical Properties in 45-MeV-Electron-Irradiated-Type Si from 80 to 350°KPhysical Review B, 1965
- Defects in Irradiated Silicon. II. Infrared Absorption of the Si-CenterPhysical Review B, 1961
- Temperature Effect on Positron Annihilation in Condensed MatterPhysical Review B, 1958