Credibility of different calculational schemes for defects in semiconductors: their power and their limits
- 30 June 1984
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 17 (18) , 3137-3156
- https://doi.org/10.1088/0022-3719/17/18/006
Abstract
No abstract availableKeywords
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