USE OF AN ELLIPSOMETER TO DETERMINE SURFACE CLEANLINESS AND MEASUREMENT OF THE OPTICAL AND DIELECTRIC CONSTANTS OF InSb AT λ = 5461 Å
- 1 September 1965
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 7 (5) , 113-114
- https://doi.org/10.1063/1.1754331
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*Journal of the Optical Society of America, 1964
- Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometryJournal of Research of the National Bureau of Standards Section A: Physics and Chemistry, 1963
- Optical Properties of SemiconductorsPhysical Review B, 1963
- Optical Constants of Silver, Gold, Copper, and Aluminum II The Index of Refraction nJournal of the Optical Society of America, 1954