Deep-level-transient spectroscopy: System effects and data analysis
- 1 August 1979
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (8) , 5093-5098
- https://doi.org/10.1063/1.326665
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Capacitance Transient SpectroscopyAnnual Review of Materials Science, 1977
- New Developments in Defect Studies in SemiconductorsIEEE Transactions on Nuclear Science, 1976
- A correlation method for semiconductor transient signal measurementsJournal of Applied Physics, 1975
- Deep-level transient spectroscopy: A new method to characterize traps in semiconductorsJournal of Applied Physics, 1974