On the Increased Sensitivity of X-Ray Rocking Curve Measurements by Triple-Crystal Diffractometry
- 16 September 1985
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 91 (1) , K31-K33
- https://doi.org/10.1002/pssa.2210910147
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Effect of diffuse scattering in the strain profile determination by double crystal X-ray diffractionPhysica Status Solidi (a), 1985
- X‐ray triple‐crystal diffractometer investigation of arsenic implanted silicon after pulsed laser irradiationCrystal Research and Technology, 1984
- Triple crystal diffractometer investigations of silicon crystals with different collimator-analyzer arrangementsPhysica Status Solidi (a), 1982
- Separate measurements of dynamical and kinematical X-ray diffractions from silicon crystals with a triple crystal diffractometerPhysica Status Solidi (a), 1979