Reactions and diffusion between an Al film and a ti substrate
- 1 January 1983
- journal article
- Published by Springer Nature in Metallurgical Transactions A
- Vol. 14 (1) , 61-66
- https://doi.org/10.1007/bf02643738
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The approximation of symmetric X-ray peaks by Pearson type VII distributionsJournal of Applied Crystallography, 1977
- An x-ray study of diffusion in the Cu-Ag systemJournal of Applied Physics, 1976
- Diffusion in the titanium-aluminium system—I. Interdiffusion between solid Al and Ti or Ti-Al alloysActa Metallurgica, 1973