Memory Effects in Quadrupole SIMS

Publisher Website

1 January 1986

book chapter
Published by Springer Nature

p. 112-114
https://doi.org/10.1007/978-3-642-82724-2_25

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Improved secondary-ion extraction in a quadrupole-based ion microprobe
International Journal of Mass Spectrometry and Ion Physics, 1982
Quantitative measurement of impurities in GaAs layers by secondary ion mass spectrometry
Surface and Interface Analysis, 1980