Magnetoresistance Measurement of the Electron Inelastic Scattering Time in Two-Dimensional Al Films in the Presence of Superconducting Fluctuations

Magnetoresistance measurements of thin Al films ($1\frac{\Omega }{\square }<R_{\square }<60\mathrm{}\frac{\Omega }{\square }$) between 2.5 and 30 K are reported and analyzed within the framework of localization theories. The influence of superconducting fluctuations is felt far above the critical temperature, in agreement with the theory of Larkin. The electron inelastic scattering is inversely proportional to the temperature in accordance with Abrahams et al. Its absolute value, which agrees with phase-slip-center measurements, is 1 order of magnitude larger than predicted.