Direct measurement of the sensitivity distribution of magnetoresistive heads by the SXM technique
- 1 September 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 28 (5) , 2307-2309
- https://doi.org/10.1109/20.179477
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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